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Nitrosyl-iron Complexes as Potent Smart Nitric Oxide Biosenors: MRI imaging Techniques in Progress
R. Sharma and S. Kwon, Florida State University, US

keywords: nitric oxide, MRI, NO-iron complex

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KLA-Tencor Introduces New Surfscan SP2XP Monitor-Wafer Defect Inspection System for IC Fabs

Today, KLA-Tencor Corporation (NASDAQ:KLAC) introduced the SurfscanŽ SP2XP, a new monitor-wafer inspection system for the integrated circuit (IC) market that builds upon the success of its sister tool with the same name, introduced last year for the wafer manufacturing market.

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